《Ieee Transactions On Reliability》是一本由IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC出版商出版的专业工程技术期刊，该刊创刊于1963年，刊期Quarterly，该刊已被国际权威数据库SCIE收录。在中科院最新升级版分区表中，该刊分区信息为大类学科：计算机科学 2区，小类学科：计算机：硬件 2区；计算机：软件工程 2区；工程：电子与电气 2区；在JCR（Journal Citation Reports）分区等级为Q1。该刊发文范围涵盖计算机：硬件等领域，旨在及时、准确、全面地报道国内外计算机：硬件工作者在该领域取得的最新研究成果、工作进展及学术动态、技术革新等，促进学术交流，鼓励学术创新。2021年影响因子为5.883，平均审稿速度约4.5个月。

Ieee Transactions On Reliability英文介绍

IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.

Ieee Transactions On Reliability中科院分区

大类学科	分区	小类学科	分区	Top期刊	综述期刊
计算机科学	2区	COMPUTER SCIENCE, SOFTWARE ENGINEERING 计算机：软件工程 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE 计算机：硬件 ENGINEERING, ELECTRICAL & ELECTRONIC 工程：电子与电气	1区 2区 2区	是	否

Ieee Transactions On Reliability期刊近9年JCR分区变化趋势

Ieee Transactions On ReliabilityJCR分区(JCR2021-2022年分区)

JCR分区等级	JCR所属学科	分区	影响因子
Q1	COMPUTER SCIENCE, HARDWARE & ARCHITECTURE	Q1	5.883
	COMPUTER SCIENCE, SOFTWARE ENGINEERING	Q1
	ENGINEERING, ELECTRICAL & ELECTRONIC	Q1

Ieee Transactions On Reliability期刊近7年影响因子变化趋势

Ieee Transactions On Reliability期刊的CiteScore值(CiteScore2021-2022年CiteScore值)

CiteScore	SJR	SNIP	学科类别	分区	排名	百分位
9.20	1.253	2.196	大类：Engineering 小类：Safety, Risk, Reliability and Quality	Q1	8 / 171	95%
9.20	1.253	2.196	大类：Engineering 小类：Electrical and Electronic Engineering	Q1	77 / 708	89%

Ieee Transactions On Reliability期刊近7年自引率变化趋势

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