SCI期刊

Ieee Design & Test

所属分类：SCI期刊

Ieee Design & Test期刊基本信息

Ieee Design & Test中文介绍

《Ieee Design & Test》是一本由IEEE Computer Society出版商出版的专业工程技术期刊，该刊创刊于2013年，刊期6 issues/year，该刊已被国际权威数据库SCIE收录。在中科院最新升级版分区表中，该刊分区信息为大类学科：工程技术 3区，小类学科：计算机：硬件 4区；工程：电子与电气 4区；在JCR（Journal Citation Reports）分区等级为Q3。该刊发文范围涵盖计算机：硬件等领域，旨在及时、准确、全面地报道国内外计算机：硬件工作者在该领域取得的最新研究成果、工作进展及学术动态、技术革新等，促进学术交流，鼓励学术创新。2021年影响因子为2.223，

Ieee Design & Test英文介绍

IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.

Ieee Design & Test中科院分区

大类学科	分区	小类学科	分区	Top期刊	综述期刊
工程技术	3区	COMPUTER SCIENCE, HARDWARE & ARCHITECTURE 计算机：硬件 ENGINEERING, ELECTRICAL & ELECTRONIC 工程：电子与电气	4区 4区	否	否

Ieee Design & Test期刊近9年JCR分区变化趋势

Ieee Design & TestJCR分区(JCR2021-2022年分区)

JCR分区等级	JCR所属学科	分区	影响因子
Q3	ENGINEERING, ELECTRICAL & ELECTRONIC	Q3	2.223
	COMPUTER SCIENCE, HARDWARE & ARCHITECTURE	Q3

Ieee Design & Test期刊近7年影响因子变化趋势

Ieee Design & Test期刊的CiteScore值(CiteScore2021-2022年CiteScore值)

CiteScore	SJR	SNIP	学科类别	分区	排名	百分位
3.30	0.597	0.962	大类：Engineering 小类：Electrical and Electronic Engineering	Q2	321 / 708	54%
			大类：Engineering 小类：Hardware and Architecture	Q3	85 / 167	49%
			大类：Engineering 小类：Software	Q3	218 / 398	45%

Ieee Design & Test期刊近7年自引率变化趋势